Testing method and programmable processor

测试方法以及可编程处理器

Abstract

The invention provides a testing method and a programmable processor. The testing method includes that at least one memory is determined by the programmable processor, and at least one hardware thread is operated by the programmable processor to test at least one memory. Besides, the invention further provides the programmable processor. By aid of the technical scheme, maximum frequency which can be reached by access of the memory in a testing process can be increased.
本发明实施例提供一种测试方法以及可编程处理器。其中,该测试方法包括:可编程处理器确定至少一个存储器;可编程处理器运行至少一个硬件线程对至少一个存储器进行测试。此外,还提供了可编程处理器。上述技术方案可以提升测试过程中对存储器进行访问能够达到的最大频率。

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